New horizons in testing : latent trait test theory and computerized adaptive testing
- 種類:
- 図書
- 責任表示:
- edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.]
- 出版情報:
- New York : Academic Press, 1983
- 著者名:
- ISBN:
- 9780127427805 [0127427805]
- 注記:
- Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al
Includes bibliographies and indexes 
類似資料:
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Springer International Publishing : Imprint: Springer |
E. Elgar |
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McGraw-Hill |
Springer New York : Imprint: Springer |
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M. Nijhoff, Distributors for the U.S. and Canada, Kluwer Academic Publishers | |
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Springer-Verlag Berlin Heidelberg | |
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John Wiley & Sons, Inc. | |
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Cambridge University Press |
New York University Bookston |
