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Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.

種類:
図書
責任表示:
editors, David K. Biegelsen, David J. Smith, S.Y. Tong
出版情報:
Pittsburgh, Pa. : Materials Research Society, 1993
著者名:
シリーズ名:
Materials Research Society symposium proceedings ; v. 295 <BA00013775>
ISBN:
9781558991903 [1558991905]  CiNii Books  Calil
注記:
Includes bibliographical references and index
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