Defect Complexes in Semiconductor Structures : Proceedings of the International School Held in Mátrafüred, Hungary, September 13 – 17, 1982. 1st ed. 1983

種類:

電子ブック

責任表示:

edited by J. Giber, F. Beleznay, I. C. Szep, J. Laszlo

出版情報:

Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1983

著者名:

• Giber, J.
• Beleznay, F.
• Szep, I. C.
• Laszlo, J.
• SpringerLink (Online service)

シリーズ名:

Lecture Notes in Physics ; 175

ISBN:

9783540394563 [3540394567]    

注記:

A technologist's view on defects -- Characterization of impurities and defects by electron paramagnetic resonance and related techniques -- Review of the possibilities of electron microscopy in the identification of defect structures -- Electrical and optical measuring techniques for flaw states -- Theory of defect complexes -- Critical comparison of the theoretical models for anomalous large lattice relaxation in III–V compounds -- Vacancy related structure defects in SiO2 — Cyclic cluster calculations compared with experimental results -- A new model for the Si-A center -- Defect complexing in iron-doped silicon -- Photoluminescence of defect complexes in silicon -- Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon -- Oxygen precipitation and the generation of secondary defects in oxygen-rich silicon -- Electrical and optical properties of oxygen-related donors in silicon formed at temperatures from 600 to 850 °c -- On the field dependence of capture a

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