Modern Developments in X-Ray and Neutron Optics. 1st ed. 2008

種類:

電子ブック

責任表示:

edited by Alexei Erko, Mourad Idir, Thomas Krist, Alan G. Michette

出版情報:

Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008

著者名:

• Erko, Alexei.
• Idir, Mourad.
• Krist, Thomas.
• Michette, Alan G.
• SpringerLink (Online service)

シリーズ名:

Springer Series in Optical Sciences ; 137

ISBN:

9783540745617 [3540745610]    

注記:

Theoretical Approaches and Calculations -- X-Ray and Neutron Optical Systems -- The BESSY Raytrace Program RAY -- Neutron Beam Phase Space Mapping -- Raytrace of Neutron Optical Systems with RESTRAX -- Wavefront Propagation -- Theoretical Analysis of X-Ray Waveguides -- Focusing Optics for Neutrons -- Volume Effects in Zone Plates -- Nano-Optics Metrology -- Slope Error and Surface Roughness -- The Long Trace Profilers -- The Nanometer Optical Component Measuring Machine -- Shape Optimization of High Performance X-Ray Optics -- Measurement of Groove Density of Diffraction Gratings -- The COST P7 Round Robin for Slope Measuring Profilers -- Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology -- Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data -- Refection/Refraction Optics -- Hard X-Ray Microoptics -- Capillary Optics for X-Rays -- Reflective Optical Arrays -- Reflective Optical Structures and Imaging Detector Systems -- CLESSIDRA: Focusing Hard X-Rays Efficiently
This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation as well as recent theoretical approaches to modelling and ray-tracing the X-ray and neutron optical systems. It is based on the joint research activities of specialists in X-ray and neutron optics from 11 countries, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002--2006. The chapters are written by leading specialists from European laboratories, universities and large facilities. In addition to new ideas and concepts, the contents provide a large amount of practical information about recently implemented devices and methods.

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