Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002. 1st ed. 2005

種類:

電子ブック

責任表示:

edited by Paula M. Vilarinho, Yossi Rosenwaks, Angus Kingon

出版情報:

Dordrecht : Springer Netherlands : Imprint: Springer, 2005

著者名:

• Vilarinho, Paula M.
• Rosenwaks, Yossi.
• Kingon, Angus.
• SpringerLink (Online service)

シリーズ名:

NATO Science Series II: Mathematics, Physics and Chemistry, Mathematics, Physics and Chemistry ; 186

ISBN:

9781402030192 [1402030193]    

注記:

Fundamentals of Functional Materials -- Functional Materials: Properties, Processing and Applications -- Scaling of Silicon-Based Devices to Submicron Dimensions -- Unsolved Problems in Ferroelectrics for Scanning Probe Microscopy -- Fundamentals of Scanning Probe Techniques -- Principles of Basic and Advanced Scanning Probe Microscopy -- Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy -- Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy -- Expanding the Capabilities of the Scanning Tunneling Microscope -- Functions of NC-AFM on Atomic Scale -- Application of Scanning Techniques to Functional Materials -- Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials -- SFM-Based Methods for Ferroelectric Studies -- Scanning Tunneling Spectroscopy -- Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films -- Microscale Conta
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrica

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