Electron Crystallography : Novel Approaches for Structure Determination of Nanosized Materials. 1st ed. 2006

種類:

電子ブック

責任表示:

edited by Thomas E. Weirich, János L. Lábár, Xiaodong Zou

出版情報:

Dordrecht : Springer Netherlands : Imprint: Springer, 2006

著者名:

• Weirich, Thomas E.
• Lábár, János L.
• Zou, Xiaodong.
• SpringerLink (Online service)

シリーズ名:

NATO Science Series II: Mathematics, Physics and Chemistry, Mathematics, Physics and Chemistry ; 211

ISBN:

9781402039201 [1402039204]    

注記:

What is Electron Crystallography? -- Exploiting Sub-Ångstrom Abilities: -- The Way Forward for Electron Crystallography -- Symmetry and Structure -- Experimental techniques -- to Electron Diffraction -- Symmetry Determinations by Electron Diffraction -- Electron Diffraction Structure Analysis -- Quantitative Electron Diffraction Structure Analysis (EDSA) -- Quantification of Texture Patterns -- Quantitative Convergent Beam Electron Diffraction -- New Instrumentation for TEM Electron Diffraction Structure Analysis: Electron Diffractometry Combined with Beam Precession -- Role of Electron Powder Diffraction in Solving Structures -- Gas-Phase Electron Diffraction for Molecular Structure Determination -- Phase Identification by Combining Local Composition from EDX with Information from Diffraction Database -- Analysis of Local Structure, Chemistry and Bonding by Electron Energy Loss Spectroscopy -- Crystal structure determination from electron microscopy data -- From Fourier Series Towards Crystal Structures -- C
During the last decade we have been witness to several exciting achievements in electron crystallography. This includes structural and charge density studies on organic molecules complicated inorganic and metallic materials in the amorphous, nano-, meso- and quasi-crystalline state and also development of new software, tailor-made for the special needs of electron crystallography. Moreover, these developments have been accompanied by a now available new generation of computer controlled electron microscopes equipped with high-coherent field-emission sources, cryo-specimen holders, ultra-fast CCD cameras, imaging plates, energy filters and even correctors for electron optical distortions. Thus, a fast and semi-automatic data acquisition from small sample areas, similar to what we today know from imaging plates diffraction systems in X-ray crystallography, can be envisioned for the very near future. This progress clearly shows that the contribution of electron crystallography is quite unique, as it enables to r

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