An Introduction to Sequential Monte Carlo. 1st ed. 2020

種類:

電子ブック

責任表示:

by Nicolas Chopin, Omiros Papaspiliopoulos

出版情報:

Cham : Springer International Publishing : Imprint: Springer, 2020

著者名:

• Chopin, Nicolas.
• Papaspiliopoulos, Omiros.
• SpringerLink (Online service)

シリーズ名:

Springer Series in Statistics ;

ISBN:

9783030478452 [3030478459]    

注記:

1 Preface -- 2 Introduction to state-space models -- 3 Beyond state-space models -- 4 Introduction to Markov processes -- 5 Feynman-Kac models: definition, properties and recursions -- 6 Finite state-spaces and hidden Markov models -- 7 Linear-Gaussian state-space models -- 8 Importance sampling -- 9 Importance resampling -- 10 Particle filtering -- 11 Convergence and stability of particle filters -- 12 Particle smoothing -- 13 Sequential quasi-Monte Carlo -- 14 Maximum likelihood estimation of state-space models -- 15 Markov chain Monte Carlo -- 16 Bayesian estimation of state-space models and particle MCMC -- 17 SMC samplers -- 18 SMC2, sequential inference in state-space models -- 19 Advanced topics and open problems.
This book provides a general introduction to Sequential Monte Carlo (SMC) methods, also known as particle filters. These methods have become a staple for the sequential analysis of data in such diverse fields as signal processing, epidemiology, machine learning, population ecology, quantitative finance, and robotics. The coverage is comprehensive, ranging from the underlying theory to computational implementation, methodology, and diverse applications in various areas of science. This is achieved by describing SMC algorithms as particular cases of a general framework, which involves concepts such as Feynman-Kac distributions, and tools such as importance sampling and resampling. This general framework is used consistently throughout the book. Extensive coverage is provided on sequential learning (filtering, smoothing) of state-space (hidden Markov) models, as this remains an important application of SMC methods. More recent applications, such as parameter estimation of these models (through e.g. particle Mark

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