High Quality Test Pattern Generation and Boolean Satisfiability. 1st ed. 2012

種類:

電子ブック

責任表示:

by Stephan Eggersglüß, Rolf Drechsler

出版情報:

New York, NY : Springer New York : Imprint: Springer, 2012

著者名:

• Eggersglüß, Stephan.
• Drechsler, Rolf.
• SpringerLink (Online service)

ISBN:

9781441999764 [1441999760]    

注記:

Part I: Preliminaries and Previous Work -- Circuits and Testing -- Boolean Satisfiability -- ATPG Based on Boolean Satisfiability -- Part II: New SAT Techniques and their Application in ATPG -- Dynamic Clause Activation -- Circuit-based Dynamic Learning -- Part III: High Quality Delay Test Generation -- High Quality ATPG for Transition Faults -- Path Delay Fault Model -- Summary and Outlook.
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a

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