>> Amazon.co.jp
このページのQRコード

Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions

種類:
図書
責任表示:
J.-M. Spaeth, H. Overhof
出版情報:
Berlin ; Tokyo : Springer, c2003
著者名:
シリーズ名:
Springer series in materials science ; 51 <BA00476831>
ISBN:
9783540426950 [3540426957]  CiNii Books  Calil
注記:
Includes bibliographical references and index
所蔵情報
Loading availability information
子書誌情報
Loading
タイトルが類似している資料

類似資料:

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12
 

Lannoo, M. (Michel), 1942-, Bourgoin, J. (Jacques), 1938-

Springer-Verlag

Fritzsche, Hellmut

World Scientific

Wertheim, Gunther K., Hausmann, A., Sander, Wilhelm

North-Holland Pub. Co.

Pilbrow, J. R.

Clarendon Press, Oxford University Press

Redfield, David, Bube, Richard H., 1927-

Cambridge University Press

Yamada Conference on Point Defects and Defect Interactions in Metals, 高村, 仁一(1921-), 堂山, 昌男(1927-), 桐谷, 道雄

University of Tokyo Press, North-Holland Publishing

Overhof, H. (Harald), 1942-, Thomas, P. (Peter), 1942-

Springer-Verlag

Randall, James C.

Academic Press

Spaeth, Johann-Martin, Niklas, Jürgen Rüdiger, Bartram, Ralph

Springer-Verlag

Güntherodt, H.-J. (Hans-Joachim), 1939-, Beck, H. (Hans), 1939-, Von Allmen, M.

Springer-Verlag

Wang, C. H. (Chin Hsien), 1939-

Academic Press

Andreev, Anatoli V., SpringerLink (Online service)

Springer US : Imprint: Springer