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Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995

種類:
図書
責任表示:
edited by Masashi Suezawa and Hiroshi Katayama-Yoshida
出版情報:
Zürich, Switzerland : Trans Tech Publications, c1995
著者名:
シリーズ名:
Materials science forum ; v. 196-201 <BA00294222>
ISBN:
9780878497164 [0878497161] (: set)  CiNii Books  Calil
9780878497126 [0878497129] (pt. 1)  CiNii Books  Calil
9780878497133 [0878497137] (pt. 2)  CiNii Books  Calil
9780878497140 [0878497145] (pt. 3)  CiNii Books  Calil
9780878497157 [0878497153] (pt. 4)  CiNii Books  Calil
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