Characterization of epitaxial semiconductor films
- 種類:
- 図書
- 責任表示:
- edited by Henry Kressel
- 出版情報:
- Amsterdam ; New York : Elsevier Scientific Pub. Co., 1976
- 著者名:
- Kressel, Henry <DA02537955>
- シリーズ名:
- Methods and phenomena, their applications in science and technology ; v. 2 <BA00060458>
- ISBN:
- 9780444414380 [044441438X]
- 注記:
- "Published as a special issue of Thin solid films, vol. 31, issues 1 and 2."
Includes bibliographical references 
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